Suppose that certain electronic components have lifetimes that are exponentially distributed: f(t|τ) = (1/τ)exp(-t/τ),t > 0. Five new components are put on test, the first one fails at 100 days, and no further observations are recorded.
a. What is the likelihood function of τ?
b. What is the mle of τ?
c. What is the sampling distribution of the mle?
d. What is the standard error of the mle?