Redraw the circuit of figure 1-22 to establish a scan chain

Question

Instead of using dual-port flip-flops of the type shown in Figure 10-8, scan testing can be accomplished using standard D flip-flops with a mux on each D input to select D₁ or D₂. Redraw the circuit of Figure 1-22 to establish a scan chain using D flip-flops and muxes. A test signal (T) should control the muxes.