Instead of using dual-port flip-flops of the type shown in Figure 10-8, scan testing can be accomplished using standard D flip-flops with a mux on each D input to select D1 or D2. Redraw the circuit of Figure 1-22 to establish a scan chain using D flip-flops and muxes. A test signal (T) should control the muxes.
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![2125_6cd1f6c4-f76e-4df8-9f34-d1a2d6b192f6.png](https://secure.tutorsglobe.com/CMSImages/2125_6cd1f6c4-f76e-4df8-9f34-d1a2d6b192f6.png)