1. A diffused silicon p-n junction has a linearly graded junction on the p-side with a = 1019 cm-4, and a uniform doping of 3 x 1014 cm-3 on the n-side. If the depletion layer width of the p-side is 0.8μm at zero bias, find the total depletion layer width, built-in potential and maximum field at zero bias.
2. Determine the n-type doping concentration to meet the following specifications for a Si p-n junction:
NA = 1018 cm-3, δmax = 4 x 105V/cm at VR = 30 V, T = 300 K.
3. For a silicon linearly graded junction with a impurity gradient of 1020 cm-4, calculate the built-in potential and the junction capacitance at reverse bias of 4 V (T = 300 K).
4. Calculate the applied reverse-bias voltage at which the ideal reverse current in a p-n junction diode at T = 300 K reaches 95% of its reverse saturation current value.
5. Calculate the theoretical barrier height and built-in potential in a metal-semiconductor diode for zero applied bias. Assume the metal work function is 4.55 eV, the electron affinity is 4.01 eV, and ND = 2 x 1016cm-3 at 300 K.
6. Copper is deposited on a carefully prepared n-type silicon substrate to form an ideal Schottky diode. Φm = 4.65 eV, the electron affinity is 4.01 eV, ND = 3 x 1016 /cm3, and T = 300 K. Calculate the barrier height, the built-in potential, the depletion-layer width, and the maximum field at a zero bias.
7. The capacitance of a Au-n-type GaAs Schottky barrier diode is given by the relation 1/C2 = 1.57 x 105 - 2.12 x 105 Va, where C is expressed in μF and Va is in volts. Taking the diode area to be 10-1 cm2, calculate the built-in potential, the barrier height, the dopant concentration, and the work function.